| Author: |
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R. Egerton
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| Title: |
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Electron Energy-Loss Spectroscopy in the Electron Microscope (The Language of Science) |
| Moochable copies: |
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No copies available |
| Amazon suggests: |
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| Topics: |
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| Published in: |
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English |
| Binding: |
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Hardcover |
| Pages: |
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500 |
| Date: |
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1996-05-31 |
| ISBN: |
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0306452235 |
| Publisher: |
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Springer |
| Weight: |
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1.9 pounds |
| Size: |
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6.26 x 1.26 x 9.33 inches |
| Edition: |
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2nd |
Amazon prices: |
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| Description: |
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Product Description
The Second Edition explores several new applications of EELS developed during the last ten years. The chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections.
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| URL: |
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http://bookmooch.com/0306452235 |
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